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Dynamic-Widefield-Magnetometry Using Nitrogen-Vacancy Defects in Diamond (JW1A.115)

Presenter: Madhur Parashar, Indian Institute of Technology Kharagpur

Widefield magnetometers based on nitrogen-vacancy defects in diamond are temporally static requiring few to several minutes of acquisition time. Here, employing per pixel frequency lock-in detection, we demonstrate widefield magnetic field images in few-seconds timescale.

Authors:Madhur Parashar, Indian Institute of Technology Kharagpur / Dasika Shishir, Indian Institute of Technology Bombay / Alok Gokhale, Indian Institute of Technology Bombay / Anuj Bathla, Indian Institute of Technology Bombay / Sharba Bandyopadhyay, Indian Institute of Technology Kharagpur / Kasturi Saha, Indian Institute of Technology Bombay


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