• Technical Conference: 

    15 – 20 May 2022

  • Exhibition: 

    17 – 19 May 2022

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Poster

Loss INduced Switching Between Electromagnetically Induced Transparency and Critical Coupling in Chalcogenide Waveguide (JW1A.170)

Presenter: Bin Zhang, Sun Yat-Sen University

We propose a mechanism to harness the loss of phase change material (PCM) in a coupled high-Q resonators system for realizing a switching between on-chip electromagnetically induced transparency and critical coupling.

Authors:Yaodong Sun, Sun Yat-Sen University / Guiying Hu, Sun Yat-Sen University / Di Xia, Sun Yat-Sen University / Pingyang Zeng, Sun Yat-Sen University / Yi Xu, Department of Electronic Engineering, College of Information Science and Technology, Jinan University / Bin Zhang, Sun Yat-Sen University / Zhaohui Li, Sun Yat-Sen University


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